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GaN HEMT Device
650V 125mΩ 23A 100W

Maximum ratings (TC=25°C, unless otherwise specified)

Symbol

Parameter

Limited Value

Units

ID

Continuous drain current @TC=25°C

23

A

Continuous drain current @TC=100°C

15

A

IDM

Pulsed drain current @TC=25°C (pulse width: 10us)

82

A

Pulsed drain current @TC=150°C (pulse width: 10us)

62

A

VDSS

Drain to source voltage (TJ = -55°C to 150°C)

650

V

VGSS

Gate to source voltage

±20

V

PD

Maximum power dissipation @TC=25°C

100

W

TC

Operating temperature

Case

-55 to 150

°C

TJ

Junction

-55 to 150

°C

TS

Storage temperature

-55 to 150

°C

TCSOLD

Soldering peak temperature

260

°C


 Thermal Characteristics

Symbol

Parameter

Typical

Units

RθJC

Junction-to-Case

1.25

°C/W

RθJA

Junction-to-Ambient

50

°C/W


 Electrical Characteristics (TJ = 25°C, unless otherwise specified)

Symbol

Min

Typ

Max

Unit

Test Conditions

Forward Device Characteristics

VDSS -MAX

650

-

-

V

VGS=0V

BVDSS

-

1700

-

V

VGS=0V, IDSS=250μA

VGS(th)

-

1.82

-

V

VDS=VGS, ID=500μA

RDS(on)1

-

125

150

VGS=8V, ID=4A, TJ=25°C

-

250

-

VGS=8V, ID=4A, TJ=150°C

IDSS

-

8

20

μA

VDS=700V, VGS=0V, TJ =25°C

-

70

-

μA

VDS=700V, VGS=0V, T=150°C

IGSS

-

-

150

nA

VGS=20V

-

-

- 150

nA

VGS=-20V

CISS

-

500

-

pF

VGS=0V, VDS=650V, f=1MHz

COSS

-

50

-

pF

CRSS

-

4

-

pF

CO(er)

-

60

-

pF

VGS=0V, VDS=0 to 650V

CO(tr)

-

100

-

pF

QG

-

12.5

-

nC

VDS=400V, VGS=0V to 8V, ID=10A

QGS

-

3.7

-

QGD

-

2.2

-

tD(on)

-

16

-

nS

VDS=400V, VGS=0V to 12V, ID=10A, RG=20Ω

tR

-

10

-

tD(off)

-

52

-

tF

-

10

-

Reverse Device Characteristics

VSD

-

1.3

-

V

VGS=0V, IS=5A, TJ=25°C

-

1.9

-

VGS=0V, IS=10A, TJ =25°C

-

3

-

VGS=0V, IS=10A, TJ =150°C

tRR

-

12

-

ns

IS=10A, VGS=0V, di/dt=1000A/us, VDD=400V

QRR

-

38

-

nC

Notes: 1. Dynamic on-resistance; see Fig. 18 and 19 for test circuit and conditions.  

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